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CPSC Approves New Testing Technology

Used to detect regulated elements in children's products.

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By: TOM BRANNA

Editor

The US Consumer Product Safety Commission (CPSC) has approved High-Definition X-Ray Fluorescence (HDXRF) technology for lead in substrate testing of children’s products via test method ASTM F2853-10.HDXRF technology, used to detect regulated elements, had previously been approved by the CPSC for testing of lead in paint and other surface coatings of children’s products.


This new action by the CPSC expands the use of HDXRF for third-party testing to support product certification and clears the way for its use in “production testing” under the new CPSC Testing and Certification Rule, which became effective Feb. 8, 2013.HDXRF offers the additional benefits of taking coating and substrate measurements simultaneously and non-destructively, reducing testing time and cost. XOS, a leading provider of mission-critical materials-analysis solutions, developed the HDXRF technique.

Wet chemistry techniques require laboratory personnel to perform multiple steps and result in destruction of product samples. HDXRF is fast, non-destructive, easy to use, and provides precise results with the same accuracy as wet chemistry, according to the CPSC.

The detailed new CPSC regulation, called the 1112 Rule, approving HDXRF for lead in substrate testing and restating the agency’s April 2011 approval of HDXRF for lead in paint testing, can be accessed at www.cpsc.gov.

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